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Scientific and technological production

1 to 4 of 4 results
 
  • Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out

     Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE transactions on computer-aided design of integrated circuits and systems
    Vol. 30, num. 12, p. 1911-1922
    DOI: 10.1109/TCAD.2011.2165071
    Date of publication: 2011-12
    Journal article
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  • Impact of gate tunnelling leakage on CMOS circuits with full open defects  Open access  awarded activity

     Rodriguez-Montanes, R.; Arumi, D.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    Electronics Letters
    Vol. 43, num. 21, p. 1140-1141
    DOI: 10.1049/el:20072117
    Date of publication: 2007-10
    Journal article
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  • Diagnosis of full open defects in interconnecting lines  Open access  awarded activity

     Rodriguez-Montanes, R.; Arumi, D.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.; Lousberg, M.; Majhi, A.K.
    IEEE VLSI Test Symposium
    p. 1-6
    DOI: 10.1109/TEST.2008.4700575
    Presentation's date: 2007-05-07
    Presentation of work at congresses
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  • Letter of the Month

     Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    Award or recognition
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