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Scientific and technological production

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  • Diagnosis of full open defects in interconnecting lines  Open access  awarded activity

     Rodriguez-Montanes, R.; Arumi, D.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.; Lousberg, M.; Majhi, A.K.
    IEEE VLSI Test Symposium
    p. 1-6
    DOI: 10.1109/TEST.2008.4700575
    Presentation's date: 2007-05-07
    Presentation of work at congresses
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  • IDDQ-based diagnosis at very low voltage (VLV) for bridging defects

     Arumi, D.; Rodriguez-Montanes, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.; Lousberg, M.
    Electronics Letters
    Vol. 43, num. 5, p. 25-26
    DOI: 10.1049/el:20073573
    Date of publication: 2007-03
    Journal article
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