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Scientific and technological production

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  • MIRAS imaging validation

     Duffo, N.; Corbella, I.; Vall-llossera, M.; Camps, A.; Torres, F.; Zapata, M.; Benito, J.; Capdevila, J.
    IEEE International Geoscience and Remote Sensing Symposium
    p. 1226-1228
    DOI: 10.1109/IGARSS.2003.1294065
    Presentation's date: 2003-07-21
    Presentation of work at congresses
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