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Scientific and technological production

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  • UWB Short-Range Bifocusing Tomographic Imaging

     Jofre, L.; Papió, A.; Jornet, J.; Ceballos, P.; Romeu, J.; Blanch, S.; Cardama, A.
    IEEE transactions on instrumentation and measurement
    Vol. 57, num. 11, p. 2414-2420
    DOI: 10.1109/TIM.2008.926382
    Date of publication: 2008-09
    Journal article
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