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  • A Compact Variable-Temperature Broadband Series-Resistor Calibration

     Orloff, N.; Mateu, J.; Lewandowski, A.; King, J.; Gu, D.; Lu, X.; Collado, J.; Takeuchi, I.; Booth, J.; Rocas, E.
    IEEE transactions on microwave theory and techniques
    Vol. 59, num. 1, p. 188-195
    DOI: 10.1109/TMTT.2010.2091200
    Date of publication: 2010-12-10
    Journal article
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