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Scientific and technological production

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  • Profiling memory vulnerability of big-data applications

     Rameshan, N.; Birke, R.; Navarro, L.; Vlassov, V.; Urgaonkar, B.; Kesidis, G.; Schmatz, M.; Chen, L.
    Annual IEEE/IFIP International Conference on Dependable Systems and Networks
    p. 258-261
    DOI: 10.1109/DSN-W.2016.58
    Presentation's date: 2016
    Presentation of work at congresses
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