
Wang, B.; Switowski, K.; Cojocaru, C.; Roppo, V.; Sheng, Y.; Scalora, Michael; Kisielewski, J.; Pawlak, D.; Vilaseca, R.; Akhouayri, H.; Krolikowski, W.; Trull, J.
Optics express
Vol. 26, num. 2, p. 1083-1096
DOI: 10.1364/OE.26.001083
Date of publication: 2018-01-22
Journal article