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Scientific and technological production  (6 results)

• Postbond test of through-silicon vias with resistive open defects  

   Rodriguez-Montanes, R.; Arumi, D.; Figueras, J.
  IEEE transactions on very large scale integration (VLSI) systems
  Vol. 27, num. 11, p. 2596-2607
  DOI: 10.1109/TVLSI.2019.2925971
  Date of publication: 2019-07-17
  Journal article

• Logic decomposition and adaptive clocking for the optimization of digital circuits  

  Department of Computer Science, Universitat Politècnica de Catalunya
  Theses

• Contribución al estudio de las Interferencias Electromagnéticas conducidas en Circuitos Integrados  

   Berbel, N.
  Department of Electronic Engineering, Universitat Politècnica de Catalunya
  Theses

• Resistive open defect characteritzation in 3D 6T SRAM memories

   Castillo, R.; Arumi, D.; Rodriguez-Montanes, R.
  Conference on Design of Circuits and Integrated Systems
  p. 1-6
  Presentation's date: 2014-11-26
  Presentation of work at congresses

• Multilevel approach to the reliability-aware design of analog and digital integrated circuits

   Rubio, A.; Mateo, D.; Moll, F.; Aragones, X.; Altet, J.; Reverter, F.; Calomarde, A.; Nunes, D.; Perez, J.; Pouyan, P.
  Competitive project

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